Memory Program Testing
EEPROMs, Flash/Memory Chips are Programmably Tested and Verified
Memory devices come in numerous forms in terms of pin count, memory size, package type etc. Memory devices however have long been a favorite target for counterfeiting. The program test is carried out on the memory by using our numerous socket adaptors that we hold in stock and our range of memory testers to detect defective devices and counterfeit components.
In some cases, there will be regions like OTP (One Time Programmable) regions that if used, will reder these devices unuseable, although the rest of the device may still be in good condition. Our test service allows us to detect such anomalies as well as cycle testing, to prove the life of the devices will continue.
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- Passed Programming Test
- Failed Programming Test
- Flash/Memory Programming Test
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